ATML
Encyclopedia
Automatic Test Markup Language (ATML) is a collection of XML Schemas
that allows Automatic Test Systems (ATS
) to exchange test information in a common format adhering to the XML
standard.
The purpose of ATML is to support test programs, test asset, and unit under test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and
diagnostic information between the various components of the test system.
The family of standards are developed by IEEE Standards Coordinating Committee 20 (SCC20) and are composed of
Typically ATML information would be used in the following senarios:
XML Schema
XML Schema, published as a W3C recommendation in May 2001, is one of several XML schema languages. It was the first separate schema language for XML to achieve Recommendation status by the W3C...
that allows Automatic Test Systems (ATS
ATS
-Societies:*Adventist Theological Society*American Temperance Society, an early American civic organization promoting temperance*American Thoracic Society, a society for lung physicians, health related professionals and researchers-Systems:...
) to exchange test information in a common format adhering to the XML
XML
Extensible Markup Language is a set of rules for encoding documents in machine-readable form. It is defined in the XML 1.0 Specification produced by the W3C, and several other related specifications, all gratis open standards....
standard.
The purpose of ATML is to support test programs, test asset, and unit under test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and
diagnostic information between the various components of the test system.
The family of standards are developed by IEEE Standards Coordinating Committee 20 (SCC20) and are composed of
- ATML IEEE Std 1671 Base Standard
- Test Description IEEE Std 1671.1
- Instrument Description IEEE Std 1671.2
- UUT Description IEEE Std 1671.3
- Test Configuration Description IEEE Std 1671.4
- Test Adaptor Description IEEE Std 1671.5
- Test Station Description IEEE Std 1671.6
- Signal and Test Definition IEEE Std 1641
- Test Results IEEE Std 1636.1
Typically ATML information would be used in the following senarios:
- Data that will be utilized for the design, development, and utilization of automatic test equipment(ATE)
- Data that will be utilized for the design, development, and utilization of test program sets (TPSs) to test a product (e.g. UUT) on a particular ATE.
- Product design data that will be utilized during the testing of the product (e.g. UUT).
- Shared usage of maintenance data and the results of testing a product (e.g. UUT).
- Testing requirements of a particular product (e.g. UUT).
- Data that will be utilized for the design, development, and utilization of instrumentation that will be utilized within a particular ATS configuration.
- A definition of allowable ATS configurations that can be use to test and evaluate a particular product (e.g. UUT).
- A definition of the capabilities of ATSs as well as the resources within the ATS.
- Recording and exchanging values of measurements and tests